Title：Deep Learning in Defect Assessment of Optoelectronic Devices

Abstract：Photonic assembly is a popular manufacturing technique which is broadly exploited in rapid prototyping and fabricating components with complex geometries. A novel event-based defect assessment framework is going to be introduced in this lecture to minimize the occurrence of machine breakdowns and component failures during the assembly process. The formulation of the defect assessment model is based on certain inline quality and condition monitoring equipment that helps to realize the zero-defect manufacturing strategy. Two industrial case studies are presented about the online quality prediction and assessment of laser devices. The assessment model is tested in both cases to build the sequence of events or the genomics of production, where a combination of contiguous normally recurring events leads to defective or non-defective products, as the main inputs to the production cost model (output).

Speaker：Hang Geng，University of Electronic Science and Technology of China, Doctor.

Date：4:00pm-6:00pm 2023-7-28（Friday）.

Venue: 208,School of Mathematical Science

Organizer：School of Mathematical Science

Students and teachers are welcome.